The effect of electromagnetic retardation on the rupture process of a verythin liquid film

Effects of electromagnetic retardation on the rupture process of a very thi n liquid film coated on a flat plate are studied. The analysis results indi cate that the electromagnetic retardation effect (D) for the case A > 0 (at traction) is a stabilization factor, which prolongs the rupture time. The w avenumber of the most unstable mode is decreasing as D increases. It is als o found that the linear solution of rupture time T-LM is larger than the no nlinear rupture time T-NM, but the gradient of T-LM to D is comparable to t hat of TNM. (C) 1999 Academic Press.