Several series of poly(arylene ether)s with trifluoromethyl substituents we
re prepared and characterized. These materials are potential candidates for
the use as low dielectric constant insulators (intermetal dielectrics, IMD
, and interlayer dielectrics, ILD) on microchips. Thermal stability up to 4
50 degrees C and a dielectric constant below 3 preferably below 2.5) is req
uired for this application. The thermal stability of the poly(arylene ether
)s was increased from 320 degrees C to more than 500 degrees C by optimizat
ion of the structure of the repeating unit. The dielectric constant of one
of the most promising structures was determined to be 2.8. In addition, pla
sma polymerized thin films from hexafluorobenzene, tetrafluorobenzene, perf
luorotoluene and perfluorodecaline were prepared and characterized with res
pect to solubility, dielectric constant, adhesion, and thermal stability.