Semiconducting chromium disilicide (CrSi2) nanocrystals were prepared by th
e are plasma method, and characterized by X-ray diffraction and transmissio
n electron microscopy. The pressure-induced semiconductor-metal transition
in CrSi2 nanocrystals was investigated in a diamond anvil cell by electrica
l resistance measurements at high pressure. The pressure dependence of resi
stance at room temperature in the pressure range of 0-10 GPa revealed an ex
ponential decrease up to 3.2 GPa, indicating a linear closing of the energy
gap, followed by an almost pressure-independent metallic regime. This phas
e transition is discussed in terms of previous band structure calculations.
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