A new UHV diffractometer for surface structure and real time molecular beam deposition studies with synchrotron radiations at ESRF (vol B149, pg 213,1999)

Citation
R. Baudoing-savois et al., A new UHV diffractometer for surface structure and real time molecular beam deposition studies with synchrotron radiations at ESRF (vol B149, pg 213,1999), NUCL INST B, 159(1-2), 1999, pp. 120-120
Citations number
1
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
159
Issue
1-2
Year of publication
1999
Pages
120 - 120
Database
ISI
SICI code
0168-583X(199910)159:1-2<120:ANUDFS>2.0.ZU;2-N