X-ray topographic study of striation formation in layer growth of crystalsfrom solutions

The Lang X-ray topography method and double-crystal plane-wave X-ray topogr aphy combined with image treatment have been used to study the zonal inhomo geneity formation during crystal growth from solutions. It is shown that st riation formation in crystals can be caused not only by the variations of t he external growth conditions, but also by the action of some 'internal' fa ctors such as the variations in the dislocation structure of the crystal an d modification of the growth-step distribution on the growing faces. The ho mogeneity of rapidly grown KDP crystals (10-16 mm d(-1)) was quantitatively evaluated with accuracy of ca. 10(-7) Angstrom.