A microdiffraction method for the characterization of partial disclinations in plastically deformed metals by TEM

Citation
V. Klemm et al., A microdiffraction method for the characterization of partial disclinations in plastically deformed metals by TEM, PHYS ST S-A, 175(2), 1999, pp. 569-576
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
ISSN journal
00318965 → ACNP
Volume
175
Issue
2
Year of publication
1999
Pages
569 - 576
Database
ISI
SICI code
0031-8965(19991016)175:2<569:AMMFTC>2.0.ZU;2-5
Abstract
The disclination concept can be used to describe rotational substructures d eveloping under large-strain deformation of crystalline metals. The paper p resents a TEM microdiffraction method using local misorientation measuremen ts which allows the identification of disclinations. Copper single as well as polycrystals rolled down to 50% and 70% thickness reduction at room temp erature were investigated and partial disclinations were found in triple ju nctions of cell-block boundaries. The power of the partial disclinations li es in the range of 1.5 degrees to 2 degrees, in agreement with theoretical expectations.