The formation and binding energies, the ionization levels, the structures,
and the local vibrations of O-i, O-2i, O-3i, VO, VO2, and V2O (V = vacancy)
in silicon are calculated using a self-consistent total-energy pseudopoten
tial method. The most important results are as follows: The ionization leve
ls and associated structures are given for VO and V2O as well as the local
vibration modes for the negative charge states of VO. The experimental freq
uency of O-i at 517 cm(-1) is associated tentatively with an oxygen-induced
silicon mode of weakly interacting O-i's. We find two competing structures
for O-2i : the staggered configuration and the skewed O-i-Si-Si-O-i config
uration with the binding energies of 0.2 and 0.1 eV, respectively. The expe
rimental frequencies of O-2i at 1060, 1012, 690, and 556 cm(-1) are found t
o originate from the staggered O-2i The experimental frequency of O-2i at 1
105 cm(-1) is found to originate from the skewed O-i-Si-Si-O-i configuratio
n of O-2i. The calculated effects of pressure on the structures and local v
ibration frequencies (Gruneisen parameters) of O-i and O-2i are presented.
[S0163-1829(99)06535-2].