X-ray photoelectron diffraction and Auger electron diffraction from TiO2(100)

Full-hemispherical x-ray photoelectron (Ti2p/O1s) and x-ray stimulated Auge r electron (TiL3M23M23/O KVV) intensity distributions have been measured fr om TiO2(100)1 x 1 at relatively high-angular resolution (+/- 1.8 degrees). The results are compared with theoretical calculations using a multipole R- factor analysis. Multiple scattering up to fifth order and a slab thickness of similar to 16 Angstrom are needed to obtain optimum agreement with expe rimental photoelectron distributions. We also investigate the contribution of the final state wave function in the Auger-electron diffraction patterns and show that it is possible to determine the symmetry of the final state angular momenta for oxides such as TiO2. Both the x-ray photoelectron diffr action and the x-ray stimulated Auger intensity distributions are found to be insensitive to details of the surface structure. [S0163-1829(99)03531-6] .