Photoconductivity spectral characteristics of semiconductors with exponential fundamental absorption edge

Citation
Ai. Vlasenko et al., Photoconductivity spectral characteristics of semiconductors with exponential fundamental absorption edge, SEMICONDUCT, 33(11), 1999, pp. 1171-1174
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTORS
ISSN journal
10637826 → ACNP
Volume
33
Issue
11
Year of publication
1999
Pages
1171 - 1174
Database
ISI
SICI code
1063-7826(199911)33:11<1171:PSCOSW>2.0.ZU;2-N
Abstract
An analysis has been performed of photoconductivity spectral characteristic s of semiconductors with an exponential fundamental absorption edge as func tions of the surface recombination rate and sample thickness. It is shown, in particular, that in crystals of CdxHg1-xTe (x approximate to 0.2) the sp ectral position of the photoconductivity maximum over a wide range of value s of these parameters can be used, with an error not exceeding 1%, to deter mine the effective band gap and, consequently, the composition of the mater ial. (C) 1999 American Institute of Physics. [S1063-7826(99)00411-1].