Nanotribological behavior of C-60 films at an extremely low load

Citation
S. Okita et al., Nanotribological behavior of C-60 films at an extremely low load, SURF SCI, 442(1), 1999, pp. L959-L963
Citations number
6
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
442
Issue
1
Year of publication
1999
Pages
L959 - L963
Database
ISI
SICI code
0039-6028(19991110)442:1<L959:NBOCFA>2.0.ZU;2-I
Abstract
We have studied the nanotribological behavior of C-60 films formed on a KCl (001) surface at an extremely low load, using scanning force microscopy (SF M). It has been observed that the SFM tip undergoes molecularly resolved st ick-slip motion depending on scanning direction. The frictional force at th e relative humidity (RH) of 20% is about a quarter that in dry argon. The d ecrease in frictional force at 20% RH comes from the lower stiffness of the tip-sample contact, indicating the mobility of C-60 molecules, such as rol ling and/or translation due to water adsorption. (C) 1999 Elsevier Science B.V. All rights reserved.