Formation and migration energies of interstitials in silicon under strain conditions

Citation
T. Halicioglu et Dm. Barnett, Formation and migration energies of interstitials in silicon under strain conditions, SURF SCI, 441(2-3), 1999, pp. 265-269
Citations number
11
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
441
Issue
2-3
Year of publication
1999
Pages
265 - 269
Database
ISI
SICI code
0039-6028(19991101)441:2-3<265:FAMEOI>2.0.ZU;2-T
Abstract
Simulation calculations are conducted for Si substrates to analyze the form ation and diffusion energies of interstitials under strain condition using statics methods based on a Stillinger-Weber-type potential function. Defect s in the vicinity of the surface region and in the bulk are examined, and t he role played by compressive and tensile strains on the energetics of inte rstitials is investigated. The results indicate that strain alters defect e nergetics, which, in turn, modifies their diffusion characteristics. (C) 19 99 Elsevier Science B.V. All rights reserved.