Tensor LEED analysis for the Cu(111)-(root x root 7)R19.1 degrees-S surface structure

Citation
M. Saidy et Kar. Mitchell, Tensor LEED analysis for the Cu(111)-(root x root 7)R19.1 degrees-S surface structure, SURF SCI, 441(2-3), 1999, pp. 425-435
Citations number
36
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
441
Issue
2-3
Year of publication
1999
Pages
425 - 435
Database
ISI
SICI code
0039-6028(19991101)441:2-3<425:TLAFTC>2.0.ZU;2-E
Abstract
A tensor LEED analysis is reported for the (root 7 x root 7)R19.1 degrees s tructure formed by S at the Cu(lll)surface. A new structural model is found which corresponds to a modified version of the copper sulphide overlayer m odel first proposed by Domange and Oudar. In that model, the topmost layer has 3/7 monolayer each of Cu and S atoms, but the modification involves one S atom per unit mesh moving down to displace a Cu atom from the second met al layer. Relaxations among the topmost Cu atoms result in one S atom being effectively three-fold coordinate while the other two are sixfold coordina te and 12-fold coordinate: the averaged S-Cu bond lengths are indicated to equal 2.19, 2.47 and 2.62 Angstrom respectively. Some discussion is include d of factors that may influence this choice of surface structure. (C) 1999 Elsevier Science B.V. All rights reserved.