Roughness and critical exponents analysis of diamond films by AFM imaging

Authors
Salvadori, MC Silveira, MG Cattani, M
Citation
Mc. Salvadori et al., Roughness and critical exponents analysis of diamond films by AFM imaging, THIN SOL FI, 354(1-2), 1999, pp. 1-4
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
354
Issue
1-2
Year of publication
1999
Pages
1 - 4
Database
ISI
SICI code
0040-6090(19991008)354:1-2<1:RACEAO>2.0.ZU;2-O
Abstract
We have synthesized diamond films by plasma assisted chemical vapor deposit ion on silicon substrates. The roughness and dynamic critical exponents of these films have been measured using an Atomic Force Microscope. Our experi mental results are compared with the theoretical predictions of Kardar et a l. [9] (Phys. Rev. Lett. 56 (1986) 889. (C) 1999 Elsevier Science S.A. All rights reserved.