Copper indium disulphide CuInS2 thin films were prepared by spray pyrolysis
technique. Improvement of CuInS2 films stoichiometry was found by increasi
ng the sulphur content in the sprayed solution. X-ray diffraction, transmis
sion and electrical resistivity results are discussed as a function of the
film composition. The films were single-phase and showed a preferred orient
ation (112), with chalcopyrite characteristic peak (103) for high sulphur c
ontent. P-type CuInS2 with a conductivity value in the range 10(-1)-10(-3)
Omega(-1) cm(-1) and a gap energy of about 1.4 eV were obtained. (C) 1999 E
lsevier Science S.A. All rights reserved.