M. Ramm et al., Studies of amorphous carbon using X-ray photoelectron spectroscopy, near-edge X-ray-absorption fine structure and Raman spectroscopy, THIN SOL FI, 354(1-2), 1999, pp. 106-110
We report core level and valence band X-ray photoelectron spectroscopy (XPS
), carbon K and oxygen K near-edge X-ray-absorption fine structure spectros
copy (NEXAFS), and Raman spectroscopy results of plasma-deposited amorphous
carbon generated from fullerene C-60. In comparison with evaporated C-60,
the C 1s peak is broader and asymmetric for the amorphous carbon film and i
ts shake-up satellites disappear. The valence band shows three fairly broad
peaks. Only one prominent pi* resonance occurs in the NEXAFS spectrum. Rec
ognizable structures appear in the sigma* region indicating the formation o
f new bonds. In the Raman spectrum the typical D and G bands were observed.
The amorphization of C60 and post-plasma functionalization of the surface
after exposure to atmosphere cause changes in the electronic structure. (C)
1999 Elsevier Science S.A. All rights reserved.