Effect of oxygen content and thickness of sputtered RuOx electrodes on theferroelectric and fatigue properties of sol-gel PZT thin films

Citation
Cw. Law et al., Effect of oxygen content and thickness of sputtered RuOx electrodes on theferroelectric and fatigue properties of sol-gel PZT thin films, THIN SOL FI, 354(1-2), 1999, pp. 162-168
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
354
Issue
1-2
Year of publication
1999
Pages
162 - 168
Database
ISI
SICI code
0040-6090(19991008)354:1-2<162:EOOCAT>2.0.ZU;2-S
Abstract
Sol-gel PZT thin-film capacitors with reactive sputtered RuOx electrodes we re fabricated. The ferroelectric and fatigue properties of the capacitors w ere investigated with various oxygen content in the electrodes and differen t electrode thickness. Our results show that increase in oxygen content in the electrodes would improve the fatigue properties of the capacitors and t he remanent polarization shows a maximum at a 10% oxygen partial pressure. These fatigue results are consistent with the oxygen vacancy model. Conside rable degradation in ferroelectric and fatigue properties of the capacitors was observed when the electrode thickness was below 230 nm. Oxygen deficie ncy in the thin electrodes was detected through AES measurement. We propose that the effect of electrode thickness is attributed to the oxygen diffusi on in the bottom electrode layers. (C) 1999 Elsevier Science S.A. All right s reserved.