Depth-resolved X-ray analysis of residual stresses in graded PVD coatings of Ti(C,N)

Citation
T. Dummer et al., Depth-resolved X-ray analysis of residual stresses in graded PVD coatings of Ti(C,N), Z METALLKUN, 90(10), 1999, pp. 780-787
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science",Metallurgy
Journal title
ZEITSCHRIFT FUR METALLKUNDE
ISSN journal
00443093 → ACNP
Volume
90
Issue
10
Year of publication
1999
Pages
780 - 787
Database
ISI
SICI code
0044-3093(199910)90:10<780:DXAORS>2.0.ZU;2-#
Abstract
Thin hard coatings are widely employed in order to improve the efficiency o f cutting and forging processes by increasing wear and corrosion resistance of the tools. Recent investigations have shown that PVD-gradient coatings of Ti(C,N) on cutting edges of cemented carbide exhibit a significantly gre ater wear resistance than conventional TiC or TiN coatings. However, beside the microstructure and composition the residual stress state in the coatin gs strongly influence the in-service performance. In addition to TEM and SE M investigation on the microstructure, X-ray residual stress analyses on Ti (C,N)-gradient coatings were performed. The special approach employed for t he non-destructive depth-resolved determination of the residual stress stat es and stress-free lattice parameters in the gradient coatings is presented together with results obtained from selected Ti(C,N)-gradient coatings.