Third-order optical nonlinearity in ZnO microcrystallite thin films

Citation
Wl. Zhang et al., Third-order optical nonlinearity in ZnO microcrystallite thin films, APPL PHYS L, 75(21), 1999, pp. 3321-3323
Citations number
28
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
21
Year of publication
1999
Pages
3321 - 3323
Database
ISI
SICI code
0003-6951(19991122)75:21<3321:TONIZM>2.0.ZU;2-D
Abstract
We report the measurement of third-order optical nonlinearity (chi((3))) of ZnO microcrystallite thin films near the excitonic resonance at various te mperatures using the femtosecond degenerate four-wave-mixing technique. The measured chi((3)) response times are 270, 240, and 160 fs at 4.2 K, 77 K, and room temperature, respectively. The values of chi((3)) range from 10(-7 ) to 10(-4) esu. The maximum values of chi((3)) always correspond to the ab sorption peaks at different temperatures. Room-temperature excitonic enhanc ement of chi((3)) is also observed. (C) 1999 American Institute of Physics. [S0003-6951(99)05047-0].