J. Zhu et al., Crystalline properties of strontium barium niobate thin films produced by pulsed laser deposition, CRYST RES T, 34(9), 1999, pp. 1205-1211
Highly oriented strontium barium niobate (SBN) thin films have been grown o
n MgO {100} substrates by pursed laser deposition. The films have been char
acterised by X-ray diffraction (XRD), scanning electron microscopy and atom
ic force microscopy. XRD theta - 2 theta scans indicate that the single pha
se crystalline SBN layers with the {001} orientation perpendicular to the p
lane of the substrate. Because of the difference between the thermal expans
ion coefficients of the SBN thin film and the MgO {100} substrate, it is ne
cessary to adapt a slow cooling rate after deposition to retain the highly
oriented SBN thin film on the substrate. The presence of non-uniform residu
al strain in SBN thin film has been analysed from broadening of the (001) S
BN film diffraction lines. The influence of oxygen partial pressure on the
crystalline properties of SBN thin films have also been investigated.