Measurement of contact line tension by analysis of the three-phase boundary with nanometer resolution

Authors
Pompe, T Fery, A Herminghaus, S
Citation
T. Pompe et al., Measurement of contact line tension by analysis of the three-phase boundary with nanometer resolution, J ADHES SCI, 13(10), 1999, pp. 1155-1164
Citations number
26
Categorie Soggetti
Material Science & Engineering
Journal title
JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY
ISSN journal
01694243 → ACNP
Volume
13
Issue
10
Year of publication
1999
Pages
1155 - 1164
Database
ISI
SICI code
0169-4243(1999)13:10<1155:MOCLTB>2.0.ZU;2-5
Abstract
Liquid structures on solid substrates have been imaged with a resolution in the nanometer range by scanning force microscopy in the tapping mode. Usin g substrates with an artificially patterned wettability, characteristic fea tures in the three-phase contact line were induced, which allow the contact line tension to be determined. The values in the range of -1 x 10(-10) N o btained for sessile droplets of hexaethylene glycol are consistent with the oretical predictions.