Electroluminescence and photoelectric properties of type II broken-gap n-In(Ga)As(Sb)/N-GaSb heterostructures

Citation
Kd. Moiseev et al., Electroluminescence and photoelectric properties of type II broken-gap n-In(Ga)As(Sb)/N-GaSb heterostructures, J APPL PHYS, 86(11), 1999, pp. 6264-6268
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
11
Year of publication
1999
Pages
6264 - 6268
Database
ISI
SICI code
0021-8979(199912)86:11<6264:EAPPOT>2.0.ZU;2-0
Abstract
Layers of n-InAs and n-InGaAsSb were grown by metalorganic vapor phase epit axy and liquid phase epitaxy on N-GaSb substrates. The electroluminescence, current-voltage characteristics and photocurrent spectra of these heterost ructures were studied at low temperatures. It was shown that GaSb/In(Ga)As( Sb) with InAs-rich narrow-gap solid solutions are broken-gap heterojunction s of type II at 77 and 300 K. Intense electroluminescence of the N-GaSb/n-I n(Ga)As(Sb) heterostructures was found in the spectral range of 3-4 mu m at 77 K. The origin of radiative recombination at the N-n type II broken-gap heterointerface is proposed and is in agreement with the experimental resul ts for both systems. (C) 1999 American Institute of Physics. [S0021-8979(99 )02722-X].