Inorganic contaminants in the fabrication of LiNbO3 optical waveguide devic
es are examined with regard to their effect on the ultimate device performa
nce and quality. We find a possibility that some chemicals such as a photor
esist developer, etc., leave contaminants including silicon and alkalis on
the LiNbO3 wafer, and result in an increase of light propagation loss, a pe
aling of the SiO2 layer from the wafer, and a large dc drift. (C) 1999 Amer
ican Institute of Physics. [S0021-8979(99)08023-8].