Investigations of ferroelectric-to-paraelectric phase transition of vinylidenefluoride trifluoroethylene copolymer thin films by electromechanical interferometry

Citation
K. Urayama et al., Investigations of ferroelectric-to-paraelectric phase transition of vinylidenefluoride trifluoroethylene copolymer thin films by electromechanical interferometry, J APPL PHYS, 86(11), 1999, pp. 6367-6375
Citations number
39
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
11
Year of publication
1999
Pages
6367 - 6375
Database
ISI
SICI code
0021-8979(199912)86:11<6367:IOFPTO>2.0.ZU;2-7
Abstract
Electrostrictive and piezoelectric properties for a 1.3 mu m thick film of a vinylidenefluoride/trifluoroethylene copolymer exhibiting a ferroelectric -to-paraelectric phase transition have been investigated as a function of t emperature by means of electromechanical interferometry. The electrostricti on remarkably increases in the vicinity of the phase transition temperature according to a sharp increase in the dielectric constant. For the unpoled sample in the ferroelectric phase with a polydomain structure in which the local spontaneous polarization is macroscopically cancelled out, the depend ence of the electrostriction on the square of the applied electric field is nonlinear in the ferroelectric phase, while it is linear in the paraelectr ic phase. A theoretical model which takes into account the nonlinear dielec tric constant can quantitatively explain the nonlinear contribution to the electrostriction in the vicinity of the ferroelectric-paraelectric phase tr ansition, but it underestimates the contribution in the ferroelectric phase . Interactions within and/or between the ferroelectric domains in the polyd omain structure are expected to contribute significantly to the nonlinear e lectrostriction. For poled samples a pronounced inverse-piezoelectric effec t is measured. The achieved polarization and its temperature dependence are almost the same as for thicker films reported in earlier studies, obtained by different experimental techniques. (C) 1999 American Institute of Physi cs. [S0021-8979(99)06023-5].