Shubnikov-de Haas effect and persistent photoconductivity in In0.52Al0.48As

Citation
E. Skuras et al., Shubnikov-de Haas effect and persistent photoconductivity in In0.52Al0.48As, J APPL PHYS, 86(11), 1999, pp. 6593-6595
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
11
Year of publication
1999
Pages
6593 - 6595
Database
ISI
SICI code
0021-8979(199912)86:11<6593:SHEAPP>2.0.ZU;2-L
Abstract
The Shubnikov-de Haas effect in InAlAs measured using pulsed magnetic field s up to 50 T is reported. The InAlAs samples were grown by molecular beam e pitaxy (MBE) and were either delta or slab doped with silicon at densities up to 7 x 10(12) cm(-2). Comparison of experimental subband densities with those calculated self-consistently shows that spreading of Si occurs by sur face segregation at growth temperatures of similar to 520 degrees C, simila r to its behavior in MBE-grown InGaAs. In contrast to InGaAs, the InAlAs ex hibits persistent photoconductivity which appears to be caused by a bulk de fect rather than DX(Si) states. (C) 1999 American Institute of Physics. [S0 021-8979(99)00423-5].