The present article gives a description of the vacuum chamber required for
a high luminosity electron e(+)-e(-) collider Tau-Charm factory. The beam l
ifetime, which is limited by the single particle collisions with molecules
of the residual gas, is estimated. The synchrotron radiation gas loading is
studied for the Tau-Charm factory vacuum chamber. The effect of various cl
eaning procedures on the outgassing behavior of samples of the chamber wall
is studied. It is shown that a cleaning procedure by a suitable NaOH etchi
ng gives the best results of the tested techniques for minimizing of contam
inations and outgassing rates. (C) 1999 American Vacuum Society. [S0734-210
1(99)03506-X].