The dislocation dynamics during multiple slip deformation is formulated in
terms of a simple stochastic model for the evolution of the densities of mo
bile and immobile dislocations. Randomness results in modified effective di
slocation multiplication and reaction rates which account for the topology
of the evolving microstructure. Depending on the intensity of local strain-
rate fluctuations, two types of solution can be distinguished: (1) At low n
oise levels homogeneous dislocation structures develop which are described
by a single characteristic length scale, i.e. the mean dislocation spacing.
This is the case of b.c.c. metals deformed at low temperature. (2) Above a
critical noise level self-similar dislocation cell patterns are found whic
h are characterized by a lower cut-off length, i.e. the minimum dislocation
spacing in the cell walls, and scale invariance beyond that cut-off. This
case refers to rate-insensitive f.c.c. metals, where fractal dislocation st
ructures have been identified recently [P. Hahner, K. Bay, M. Zaiser, Phys.
Rev. Lett. 81 (1998) 2470]. The model yields critical deformation conditio
ns for fractal dislocation patterning and enables one to establish relation
s between the evolution of the fractal dimension of the cell structure, the
strain-hardening behaviour, and the underlying dislocation dynamics. This
is achieved without postulating a priori that the dislocation microstructur
e be heterogeneous. (C) 1999 Elsevier Science S.A. All rights reserved.