Dislocation dynamics and work hardening of fractal dislocation cell structures

Citation
P. Hahner et M. Zaiser, Dislocation dynamics and work hardening of fractal dislocation cell structures, MAT SCI E A, 272(2), 1999, pp. 443-454
Citations number
38
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
ISSN journal
09215093 → ACNP
Volume
272
Issue
2
Year of publication
1999
Pages
443 - 454
Database
ISI
SICI code
0921-5093(19991130)272:2<443:DDAWHO>2.0.ZU;2-7
Abstract
The dislocation dynamics during multiple slip deformation is formulated in terms of a simple stochastic model for the evolution of the densities of mo bile and immobile dislocations. Randomness results in modified effective di slocation multiplication and reaction rates which account for the topology of the evolving microstructure. Depending on the intensity of local strain- rate fluctuations, two types of solution can be distinguished: (1) At low n oise levels homogeneous dislocation structures develop which are described by a single characteristic length scale, i.e. the mean dislocation spacing. This is the case of b.c.c. metals deformed at low temperature. (2) Above a critical noise level self-similar dislocation cell patterns are found whic h are characterized by a lower cut-off length, i.e. the minimum dislocation spacing in the cell walls, and scale invariance beyond that cut-off. This case refers to rate-insensitive f.c.c. metals, where fractal dislocation st ructures have been identified recently [P. Hahner, K. Bay, M. Zaiser, Phys. Rev. Lett. 81 (1998) 2470]. The model yields critical deformation conditio ns for fractal dislocation patterning and enables one to establish relation s between the evolution of the fractal dimension of the cell structure, the strain-hardening behaviour, and the underlying dislocation dynamics. This is achieved without postulating a priori that the dislocation microstructur e be heterogeneous. (C) 1999 Elsevier Science S.A. All rights reserved.