A two-layer high density printed circuit board and its reliability

Citation
S. Zhang et al., A two-layer high density printed circuit board and its reliability, MICROEL REL, 39(9), 1999, pp. 1337-1341
Citations number
7
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
39
Issue
9
Year of publication
1999
Pages
1337 - 1341
Database
ISI
SICI code
0026-2714(199909)39:9<1337:ATHDPC>2.0.ZU;2-Z
Abstract
The fabrication and reliability of a two-layer high density PCB test vehicl e are reported in this paper. The test board consisted of two copper layers that were sequentially built up on one side of a FR4 substrate and interco nnected through a photovia dielectric layer. Various rest structures were f abricated for reliability testing. Thermal cycling, 85 degrees C/85%RH agei ng, and multiple reflow excursions were performed to test the reliability o f electrical continuity and insulation. Peel strength was measured after fa brication as well as after 150 degrees C annealing and reflow excursions. I nitial results have revealed that photovias may be more reliable than conve ntional through vias. (C) 1999 Elsevier Science Ltd. All rights reserved.