T. Kamiya et al., An automated single ion hit at JAERI heavy ion microbeam to observe individual radiation damage, NUCL INST B, 158(1-4), 1999, pp. 255-259
Microbeam scanning and a single ion hit technique have been combined to est
ablish an automated beam positioning and single ion hit system at the JAERI
Takasaki heavy ion microbeam system. Single ion irradiation on preset poin
ts of a sample in various patterns can be performed automatically in a shor
t period. The reliability of the system was demonstrated using CR-39 nuclea
r track detectors. Single ion hit patterns were achieved with a positioning
accuracy of 2 mu m or less. In measurement of single event transient curre
nt using this system, the reduction of the pulse height by accumulation of
radiation damages was observed by single ion injection to the same local ar
eas. This technique showed a possibility to get some quantitative informati
on about the lateral displacement of an individual radiation effect in sili
con PIN photodiodes. This paper will give details of the irradiation system
and present results from several experiments. (C) 1999 Elsevier Science B.
V. All rights reserved.