Ion beam induced charge collection (IBICC) and time resolved IBICC (TRIBICC
) techniques were used for imaging electronic properties of cadmium zinc te
lluride (CZT) room temperature radiation detectors. The detectors were bomb
arded with a scanned 5.4 MeV He microbeam and the detector response was ana
lyzed at each point. The electron mobility (mu(e)) and lifetime (tau(e)), a
nd charge collection efficiency maps were calculated from the data. In orde
r to determine the radiation damage to the detectors, the signal deteriorat
ion was measured as the function of dose. (C) 1999 Elsevier Science B.V. Al
l rights reserved.