Aluminium and silicon determination on two Si-Al sputter targets used for magnetron sputtering

Citation
G. Terwagne et F. Bodart, Aluminium and silicon determination on two Si-Al sputter targets used for magnetron sputtering, NUCL INST B, 158(1-4), 1999, pp. 683-688
Citations number
7
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
158
Issue
1-4
Year of publication
1999
Pages
683 - 688
Database
ISI
SICI code
0168-583X(199909)158:1-4<683:AASDOT>2.0.ZU;2-J
Abstract
Si-Al coatings of different stoichiometry can be produced by unbalanced mag netron sputtering. The Si-Al alloy target used for this technique are prepa red by two different ways: Silicon and aluminium are reduced to powder and pressed together in order t o obtain a homogeneous target containing a known amount of aluminium and si licon. Si-Al alloy is produced by Pechiney (Voreppe, France) and contains small si licon grains impregnated into a Si-Al alloy. Aluminium and silicon concentrations of such alloys were measured by Proton Induce X-ray Emission (PIXE) using the microprobe facility at LARN (Namur, Belgium). Measurements were carried out in the tracks due to material remo ved by sputtering when the target is used for DC-magnetron and also in the virgin zone where no material has been removed. The results show clearly that the relative concentrations of Al and Si are not preserved when the target is sputtered with 500 eV Ar atoms. This resul t can be explained by the different sputtering yields of Al and Si and the stoichiometry of the coatings are related to the composition of the target. (C) 1999 Elsevier Science B.V. All rights reserved.