A method for constructing multi-layered thickness profiles from micro-PIXEline-scans

Authors
Nickel, J Shuaib, AN
Citation
J. Nickel et An. Shuaib, A method for constructing multi-layered thickness profiles from micro-PIXEline-scans, NUCL INST B, 158(1-4), 1999, pp. 729-735
Citations number
13
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
158
Issue
1-4
Year of publication
1999
Pages
729 - 735
Database
ISI
SICI code
0168-583X(199909)158:1-4<729:AMFCMT>2.0.ZU;2-C
Abstract
A method of converting the lateral X-ray yield intensity distributions from micro-PIXE line-scans into multi-layered thickness profiles is proposed. T he method is demonstrated by the construction of multi-layered wear pattern s of the flank faces of two types of TiN-coated high-speed steel (HSS) dril ls used in machining stainless steel workpieces. The wear features consist of three layers, namely the tool substrate, the TiN-coating and the adhered workpiece material. Differences in the wear patterns of the drills were id entified from the obtained multi-layered thickness profiles. (C) 1999 Elsev ier Science B.V. All rights reserved.