THE EFFECT OF FERTILIZER PLACEMENT ON NITROGEN UPTAKE AND YIELD OF WHEAT AND MAIZE IN CHINESE LOESS SOILS

Citation
Rm. Rees et al., THE EFFECT OF FERTILIZER PLACEMENT ON NITROGEN UPTAKE AND YIELD OF WHEAT AND MAIZE IN CHINESE LOESS SOILS, Nutrient cycling in agroecosystems, 47(1), 1997, pp. 81-91
Citations number
27
Categorie Soggetti
Agriculture Soil Science
ISSN journal
13851314
Volume
47
Issue
1
Year of publication
1997
Pages
81 - 91
Database
ISI
SICI code
1385-1314(1997)47:1<81:TEOFPO>2.0.ZU;2-2
Abstract
Field trials were carried out to study the fate of N-15-labelled urea applied to summer maize and winter wheat in loess soils in Shaanxi Pro vince, north-west China. In the maize experiment, nitrogen was applied at rates of 0 or 210 kg N ha(-1), either as a surface application, mi xed uniformly with the top 0.15 m of soil, or placed in holes 0.1 m de ep adjacent to each plant and then covered with soil. In the wheat exp eriment, nitrogen was applied at rates of 0, 75 or 150 kg N ha(-1), ei ther to the surface, or incorporated by mixing with the top 0.15 m, or placed in a band at 0.15 m depth. Measurements were made of crop N up take, residual fertilizer N and soil mineral N. The total above-ground dry matter yield of maize varied between 7.6 and 11.9 t ha(-1). The c rop recovery of fertilizer N following point placement was 25% of that applied, which was higher than that from the surface application (18% ) or incorporation by mixing (18%). The total grain yield of wheat var ied between 4.3 and 4.7 t ha(-1). In the surface applications, the rec overy of fertilizer-derived nitrogen (25%) was considerably lower than that from the mixing treatments and banded placements (33 and 36%). T he fertilizer N application rate had a significant effect on grain and total dry matter yield, as well as on total N uptake and grain N cont ents. The main mechanism for loss of N appeared to be by ammonia volat ilization, rather than leaching. High mineral N concentrations remaine d in the soil at harvest, following both crops, demonstrating a potent ial for significant reductions in N application rates without associat ed loss in yield.