We study theoretically the scattering of s-polarized light from the one-dim
ensional, randomly rough surface of a homogeneous amplifying dielectric med
ium deposited as a film on the planar surface of a semi-infinite perfectly
conducting substrate. The reflectivity of the rough him is found to be grea
ter than that of the corresponding planar film if only true guided waves su
pported by the scattering structure exist at the frequency of the incident
light; it can be smaller than that of the corresponding planar film if a le
aky guided wave also exists at the frequency of the incident Light. Althoug
h the reflectivity of an amplifying film with a planar surface is greater t
han unity for all angles of incidence, that of an amplifying Aim with a ran
dom surface tan be smaller than unity in a certain range of angles of incid
ence as a consequence of the existence of a leaky guided wave. The contribu
tion to the mean differential reflection coefficient from the incoherent co
mponent of the scattered light displays an enhanced backscattering peak and
satellite peaks (the latter if the scattering structure supports two or mo
re guided waves). The overall intensity of the light scattered incoherently
from the surface of a rough amplifying film is always greater than that of
the Light scattered from the same film with the same magnitude of the imag
inary part of its dielectric constant, but of opposite sign, irrespective o
f the presence or absence of a leaky wave at the frequency of the incident
light. However, the height and width of the enhanced backscattering peak ar
e nonmonotonic functions of the magnitude of the imaginary part of the diel
ectric constant of the aim, when a leaky wave is present, but depend monoto
nically on it when no leaky wave is present. In the case of an absorbing fi
lm these functions depend monotonically on the imaginary part of the dielec
tric constant. [S0163-1829(99)02242-0].