Deposition of potential energy in solids by slow, highly charged ions

Citation
T. Schenkel et al., Deposition of potential energy in solids by slow, highly charged ions, PHYS REV L, 83(21), 1999, pp. 4273-4276
Citations number
32
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
83
Issue
21
Year of publication
1999
Pages
4273 - 4276
Database
ISI
SICI code
0031-9007(19991122)83:21<4273:DOPEIS>2.0.ZU;2-U
Abstract
We have measured the deposition of potential energy of slow (similar to 6 x 10(5) m/s), highly charged ions in solids with an ion implanted silicon de tector. A large fraction (about 35% or 60 keV) of the potential energy diss ipated by Au69+ ions can be traced in electronic excitations deep (>50 nm) inside the solid. In contrast, only about 10% of the potential energy has b een accounted for in measurements of emitted secondary particles.