We have measured the deposition of potential energy of slow (similar to 6 x
10(5) m/s), highly charged ions in solids with an ion implanted silicon de
tector. A large fraction (about 35% or 60 keV) of the potential energy diss
ipated by Au69+ ions can be traced in electronic excitations deep (>50 nm)
inside the solid. In contrast, only about 10% of the potential energy has b
een accounted for in measurements of emitted secondary particles.