Mechanism of boron diffusion in silicon: An ab initio and kinetic Monte Carlo study

Citation
B. Sadigh et al., Mechanism of boron diffusion in silicon: An ab initio and kinetic Monte Carlo study, PHYS REV L, 83(21), 1999, pp. 4341-4344
Citations number
30
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
83
Issue
21
Year of publication
1999
Pages
4341 - 4344
Database
ISI
SICI code
0031-9007(19991122)83:21<4341:MOBDIS>2.0.ZU;2-B
Abstract
An exhaustive first-principles study of the energetics of B-Si interstitial complexes of various configurations and charge states is used to elucidate the diffusion mechanism of B in Si. Total energy calculations and molecula r dynamics simulations show that B diffuses by an interstitialcy mechanism. Substitutional B captures a Si interstitial with a binding energy of 0.90 eV. This complex is itself a fast diffuser, with no need to first "kick out " the B into an interstitial channel. The migration barrier is about 0.68 e V. Kinetic Monte Carlo simulations confirm that this mechanism leads to a d ecrease in the diffusion length with increasing temperature, as observed ex perimentally.