An exhaustive first-principles study of the energetics of B-Si interstitial
complexes of various configurations and charge states is used to elucidate
the diffusion mechanism of B in Si. Total energy calculations and molecula
r dynamics simulations show that B diffuses by an interstitialcy mechanism.
Substitutional B captures a Si interstitial with a binding energy of 0.90
eV. This complex is itself a fast diffuser, with no need to first "kick out
" the B into an interstitial channel. The migration barrier is about 0.68 e
V. Kinetic Monte Carlo simulations confirm that this mechanism leads to a d
ecrease in the diffusion length with increasing temperature, as observed ex
perimentally.