Characterization of the anisotropic chemical attack of {hk0} silicon plates in a TMAH solution - Determination of a database

Citation
Ar. Charbonnieras et Cr. Tellier, Characterization of the anisotropic chemical attack of {hk0} silicon plates in a TMAH solution - Determination of a database, SENS ACTU-A, 77(2), 1999, pp. 81-97
Citations number
23
Categorie Soggetti
Instrumentation & Measurement
Journal title
SENSORS AND ACTUATORS A-PHYSICAL
ISSN journal
09244247 → ACNP
Volume
77
Issue
2
Year of publication
1999
Pages
81 - 97
Database
ISI
SICI code
0924-4247(19991012)77:2<81:COTACA>2.0.ZU;2-5
Abstract
This paper is devoted to the study of the anisotropy of the chemical attack of (h (k) over bar 0) silicon plates in a water-T.M.A.H, solution 25% in w eight. In the first part 12 different orientations were investigated and em phasis is placed on the changes in the geometrical features of etched (h (k ) over bar 0) surfaces and in the starting circular section of thick (h (k) over bar 0) plates with the angle of cut. In the second part orientation e ffects in 2D experimental etching shapes are analysed to determine a databa se (composed of dissolution constants) which characterizes the anisotropy d f the T.M.A.H. etchant. The adequation of the database is then discussed by comparing the experimental 2D etching shapes with theoretical shapes as de rived from the database using a kinematic and tensorial model of the anisot ropic dissolution. (C) 1999 Elsevier Science S.A. All rights reserved.