Monte Carlo simulation of X-ray fluorescence spectra: Part 4. Photon scattering at high X-ray energies

Citation
L. Vincze et al., Monte Carlo simulation of X-ray fluorescence spectra: Part 4. Photon scattering at high X-ray energies, SPECT ACT B, 54(12), 1999, pp. 1711-1722
Citations number
26
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY
ISSN journal
05848547 → ACNP
Volume
54
Issue
12
Year of publication
1999
Pages
1711 - 1722
Database
ISI
SICI code
0584-8547(19991122)54:12<1711:MCSOXF>2.0.ZU;2-Z
Abstract
The photon scattering model of a Monte Carlo simulation code for synchrotro n radiation X-ray fluorescence (SRXRF) spectrometers is evaluated at high X -ray energies (60-100 keV) by means of a series of validation experiments p erformed at Beamline BW5 of HASYLAB. Using monochromatic X-rays, Compton/Ra yleigh multiple scattering experiments were performed on polypropylene, Al and Cu samples. Especially in the case of the first two matrices multiple C ompton scattering occurs with high probability. This work demonstrates that the simulation model provides a reliable estimate of the spectral distribu tion of the multiply scattered linearly polarized photon beam as observed b y an HPGe detector. Next to variations in sample composition and thickness, the ability of the code to simulate various detection geometries has also been verified. As an application of the code, the achievable detection limi ts of SRXRF for rare earth elements as obtained with white beam and monochr omatic (80 keV) excitation are compared. (C) 1999 Elsevier Science B.V. All rights reserved.