Why are metrological measurements different?

Authors
De Bievre, P
Citation
P. De Bievre, Why are metrological measurements different?, ACCRED Q A, 4(11), 1999, pp. 457-457
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ACCREDITATION AND QUALITY ASSURANCE
ISSN journal
09491775 → ACNP
Volume
4
Issue
11
Year of publication
1999
Pages
457 - 457
Database
ISI
SICI code
0949-1775(199911)4:11<457:WAMMD>2.0.ZU;2-S