Hierarchical design and test of integrated microsystems

Authors
Mukherjee, T Fedder, GK Blanton, RDS
Citation
T. Mukherjee et al., Hierarchical design and test of integrated microsystems, IEEE DES T, 16(4), 1999, pp. 18-27
Citations number
11
Categorie Soggetti
Computer Science & Engineering
Journal title
IEEE DESIGN & TEST OF COMPUTERS
ISSN journal
07407475 → ACNP
Volume
16
Issue
4
Year of publication
1999
Pages
18 - 27
Database
ISI
SICI code
0740-7475(199910/12)16:4<18:HDATOI>2.0.ZU;2-F
Abstract
Successful design of application-specific integrated microchips that can se nse and actuate as well as compute and communicate requires hierarchical de sign methodologies and tools such as those presented here.