On the integration of design and test for chips embedding MEMS

Authors
Mir, S Charlot, B
Citation
S. Mir et B. Charlot, On the integration of design and test for chips embedding MEMS, IEEE DES T, 16(4), 1999, pp. 28-38
Citations number
10
Categorie Soggetti
Computer Science & Engineering
Journal title
IEEE DESIGN & TEST OF COMPUTERS
ISSN journal
07407475 → ACNP
Volume
16
Issue
4
Year of publication
1999
Pages
28 - 38
Database
ISI
SICI code
0740-7475(199910/12)16:4<28:OTIODA>2.0.ZU;2-#
Abstract
This article illustrates how fault-based, defect-oriented test approaches b e applied to the problem of testing the next generation of chips embedding MEMS.