Test and reliability: Partners in IC manufacturing, part 2

Authors
Hawkins, CF Segura, J Soden, J Dellin, T
Citation
Cf. Hawkins et al., Test and reliability: Partners in IC manufacturing, part 2, IEEE DES T, 16(4), 1999, pp. 66-73
Citations number
12
Categorie Soggetti
Computer Science & Engineering
Journal title
IEEE DESIGN & TEST OF COMPUTERS
ISSN journal
07407475 → ACNP
Volume
16
Issue
4
Year of publication
1999
Pages
66 - 73
Database
ISI
SICI code
0740-7475(199910/12)16:4<66:TARPII>2.0.ZU;2-0
Abstract
This article discusses the major gate oxide failure modes, reliability mode ling, burn-in, and qualification testing. We present a typical method to ca lculate failure rates.