Defect detection systems for enameled copper wire, cable, and optical fiber: State of the art and current trends

Authors
Hamid, HA Wlodarski, W Brennan, F
Citation
Ha. Hamid et al., Defect detection systems for enameled copper wire, cable, and optical fiber: State of the art and current trends, IEEE ELEC I, 15(6), 1999, pp. 20
Citations number
12
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE ELECTRICAL INSULATION MAGAZINE
ISSN journal
08837554 → ACNP
Volume
15
Issue
6
Year of publication
1999
Database
ISI
SICI code
0883-7554(199911/12)15:6<20:DDSFEC>2.0.ZU;2-N