Characterization of defect-related optical absorption in ZnGeP2

Citation
Sd. Setzler et al., Characterization of defect-related optical absorption in ZnGeP2, J APPL PHYS, 86(12), 1999, pp. 6677-6681
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
12
Year of publication
1999
Pages
6677 - 6681
Database
ISI
SICI code
0021-8979(199912)86:12<6677:CODOAI>2.0.ZU;2-9
Abstract
A broad optical absorption band with a peak near 1 mu m is present in most single crystals of ZnGeP2. These same crystals have an electron paramagneti c resonance (EPR) signal which has been assigned to singly ionized zinc vac ancies. A direct correlation between the intensity of the optical absorptio n at 1 mu m and the intensity of the EPR signal has been established using a set of ZnGeP2 crystals where this absorption varied widely. These results suggest that the singly ionized zinc vacancy acceptor plays a direct role in the electronic transition(s) responsible for the 1 mu m optical absorpti on. In separate experiments, it was found that illuminating the ZnGeP2 crys tals with a He-Ne laser (632.8 nm) while at temperatures near 25 K produces an increase in the absorption at 1 mu m and an increase in the zinc vacanc y EPR spectrum. These latter results provide further evidence that the abso rption at 1 mu m is associated with the singly ionized zinc vacancy accepto r. (C) 1999 American Institute of Physics. [S0021-8979(99)07624-0].