Enhancement of critical Pr ion concentration (x(cr)) in (La1-xPrx)Ba2Cu3Oz

Citation
M. Murugesan et al., Enhancement of critical Pr ion concentration (x(cr)) in (La1-xPrx)Ba2Cu3Oz, J APPL PHYS, 86(12), 1999, pp. 6985-6992
Citations number
67
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
12
Year of publication
1999
Pages
6985 - 6992
Database
ISI
SICI code
0021-8979(199912)86:12<6985:EOCPIC>2.0.ZU;2-B
Abstract
The substitutional effect of Pr ion for La in (La1-xPrx)Ba2Cu3Oz bulk sampl es prepared under modified synthesis condition has been studied. Low field magnetization studies showed that superconductivity is retained up to the c ritical Pr ion concentration, x(cr) = 0.40. The effective magnetic moment o f Pr3+ free ion is very low in the present series of compounds. Results of X-ray absorption near-edge structure spectra for the series of (La1-xPrx)Ba 2Cu3Oz compounds with 0.00 < x < 0.60 reveal that the doped Pr ion reduces hole concentration within the CuO2 planes, leading to a destruction of supe rconductivity. (C) 1999 American Institute of Physics. [S0021-8979(99)05924 -1].