Thermoluminescence and thermal quenching measurements in SrS : Cu

In this paper we use a combination of thermoluminescence, thermal quenching , and spectroscopic techniques to investigate the interaction between Cui i on (in RF sputtered SrS:Cu) and trap states which become incorporated in th e thin films during the growth process. UV excitation was used to excite th e Cu for both time resolved and intensity dependent studies. The thermolumi nescence, thermal quenching, and temperature-dependent fluorescence transie nt measurements were analyzed to obtain values for trap depths and frequenc y factors. (C) 1999 Elsevier Science B.V. All rights reserved.