Morphologies and growth mechanisms of aluminum nitride whiskers by SHS method - Part 2

Citation
Gj. Jiang et al., Morphologies and growth mechanisms of aluminum nitride whiskers by SHS method - Part 2, J MATER SCI, 35(1), 2000, pp. 63-69
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
35
Issue
1
Year of publication
2000
Pages
63 - 69
Database
ISI
SICI code
0022-2461(200001)35:1<63:MAGMOA>2.0.ZU;2-H
Abstract
The high resolution electron microscopy was used to investigate the microst ructure of AlN whiskers. The growth mechanisms of AlN whiskers were VLS and VS mechanism. The phenomenon of stacking fault was analyzed. Moreover, the growth mechanism of dendritic crystal was proposed. (C) 2000 Kluwer Academ ic Publishers.