Interferometric measurement of the refractive index and the thermo-optic coefficient of semiconductor-doped glasses

Authors
De Nicola, S Ferraro, P Finizio, A Pierattini, G Pelli, S
Citation
S. De Nicola et al., Interferometric measurement of the refractive index and the thermo-optic coefficient of semiconductor-doped glasses, J OPT A-P A, 1(6), 1999, pp. 702-705
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS
ISSN journal
14644258 → ACNP
Volume
1
Issue
6
Year of publication
1999
Pages
702 - 705
Database
ISI
SICI code
1464-4258(199911)1:6<702:IMOTRI>2.0.ZU;2-P
Abstract
We report on an interferometric technique based on two-dimensional Fourier fringe analysis for measuring the refractive indices and the thermo-optic c oefficients of semiconductor-doped glasses suitable for optical waveguide f abrication. The principle of the measurement method is discussed. The therm o-optic coefficients of semiconductor-doped Schott glass filters have been determined in the temperature range 25-85 degrees C.