Mh. Kane et al., High-temperature electrical property and defect analysis of the quintuple perovskite layered cuprates Eu2CaBa2Cu2Ti3O14 and LaYCaBa2Cu2+xTi3-xO14-y, J SOL ST CH, 148(1), 1999, pp. 3-15
High-temperature electrical conductivity and thermopower measurements have
been performed on undoped Eu2CaBa2 Cu2Ti3O14 and doped and undoped LaYCaBa2
Cu2+xTi3-xO14. These quintuple perovskites are members of a family of order
ed perovskite-type oxides with double Cu-O sheets and have inplane Cu-O bon
d lengths comparable to known superconductors. X-ray diffraction data and t
ransmission electron microscopy show clear evidence of layering in both str
uctures. LaYCaBa2 Cu2+xTi3-xO14 exhibits a large-small rare earth ordering
on the A'/A " sites, like its quadruple perovskite counterparts. The transp
ort data indicate that these materials behave similarly to the correspondin
g quadruple perovskites, but have lower carrier concentrations. The La-Y co
mpound exhibits weaker oxygen partial pressure dependencies in the electric
al properties, which are suggestive of a decrease in undesirable oxygen int
ercalation between the CuO2 sheets. Upon doping with copper on titanium sit
es, (Cu-Ti"), a concomitant amount of oxygen vacancies, (V-o(..)), are intr
oduced, as evidenced by TGA and in situ electrical property measurements. P
ossible defect models are presented and discussed in light of data from TGA
, electrical property measurements, and quantitative high-resolution TEM, (
C) 1999 Academic Press.