Effects of soft-electrons on the microbial counts and germination of seedsof radish sprout (Daikon) and alfalfa

Electrons at acceleration voltages of 170-180 kV reduced microbial counts o f seeds of radish sprout (Daikon) and alfalfa to undetectable levels withou t any detrimental effects on the germination ability. However, electrons at 190 kV or higher lowered the germination percentage of radish sprout seeds and electrons at 200 kV lowered that of alfalfa seeds. The energies of ele ctrons at the surface of seeds (15 cm-distant from accelerator's window) at acceleration voltages of 170-180 kV were estimated to be 60-75 keV, based on the stopping powers of titanium and air. The results suggest the applica bility of soft-electron (low-energy electron) treatment to the disinfection of seeds.