XRF analysis of microsamples of semiconductor type multielement materials by the thin layer method. Determination of Cr, Co, Ni, Cu, Zn, Ga, Se, Sb, Yb

A simple and quick method of durable samples preparation by the thin layer method through direct digesting of the analysed material on the substrate h as been presented. Four- and three-component mono- and polycrystals have be en analysed. Standards have been used in calibration containing: Cr, Co, Ni , Cu, Zn, Ga, Se, Sb, Yb. To improve the correlation between the concentrat ion and the fluorescent radiation models of mathematical corrections have a dditionally been used: multiple linear regression, Lucas-Tooth-Pyne model ( L.T.P.) and de Jongh model (d.J.). Statistical parameters: detection limits for 0.5 mg samples: Cr-0.041%, Co-0.034%, Ni-0.042%, Cu-0.053%, Zn-0.054%, Ga-0.057%, Se-0.057%, Sb-0.113%, Yb-0.077%. Correlation coefficients: simp le regression 0.9946-0.9997, multiple regression 0.9974-1.0000, L.T.P. 0.99 93-1.0000, d.J. 0.9995-1.0000.